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Used Tester -- Advantest T2000

  • 2 Unit/Units
  • Tokyo Port
  • US $ 100,000 / Unit
  • 2 Unit/Units
  • 2 Unit/Units per Month
  • Tag:High Quality Used Semiconductor Equipment,Reboot Technology Services K.K
  • Supplier - Reboot Technology Services K.K.
  • JapanJapan
  • 11 - 50 People
  • Manufacturer, Distributor/Wholesaler, Business Service (Transportation, finance, travel, Ads, etc)  
  • North America,Eastern Europe,Southeast Asia,Africa,Oceania,Mid East,Eastern Asia,Western Europe
  • Ms.Elaine
  • 81-47-3062700
Post Date : December 01
Product Details
Company Profile
Inquiry Records(3)

Item specifics

Tokyo Port
US $ 100,000 / Unit
2 Unit/Units
2 Unit/Units per Month


Used Advantest T2000 Tester

48V supply for module x 1

additional 48V supply for module x 1

Module Controller

48V supply board x 2

DVM MUX board x 2

BUS SW board x 3

BUS SW electricity supply

Base cable (TH52_BASE cable) x 1

TH_28 Module cable x 1

Additional cable ( TH_28 module) x 1

DVM (r6581T) x 1

system monitor x 1

Test Head

52Slot Test Head

SYNC 36 module

Segment 37-72

EMO Switch

WP Cart: H9-910303

HIFIX for UF3000 :H7-110044

DIAG performance board: H7-710085

Measurement Module

250MHz Digital Module (128MW) (32ch/Module) liquid coolant-> 1 module 125MHz Digital Module (128MW) (32ch/Module) liquid coolant-> 31 module LCDPS Module (4AX8ch/Module) liquid coolant-> 2 module HCDPS Module (16AX4ch/Module) liquid coolant-> 2module DPS500mA Module (0.5AX32ch/Module) Air coolant


CPU(Pentium 42 GHz)

Memory: 1GB

Hard Disc

CD-R/W Drive

3.5 inch Floppu drive (1.44MB)

GP-IB Interface (1 port/board)

LCD monitor 19inch

4 port KVM Switch

10/100Base T cable

system desk

Site controller : 1 site


Memory 16bite

Hard Disc


Heat Exchange Unit x 1

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Used Prober -- Accretech UF3000

Used Prober -- Accretech UF3000

Used Prober -- Accretech UF3000

Used Prober Accretech / TSK UF3000

Chuck size 12"

Low noise: not applicable

Chuck -43 degree to +150 degree)

Temp. unified option

HiFix MHF6000, type 3

Camera for auto needle alignment

Auto needle height alignment (auto focus, GPIB, TTL) Back side ID reading option, type 6 Casette ID reading option (Omron v640) needle cleaning (ceramic stage) brush cleaning, double GP/IB interface GP-IB cable 5m RS232C test I/F CPU SP3 connection RS232C tesr I/F cable, 5m ethernet I/F shade option,( shutter for loader portion) needle mark inspection

3-64 die multi proving

Vega computer option

Bar code reader option (CPU SP4 connection)

Reader: Accretech standard, Token TCD5600 Holder Various Index function SOAK TIME option bump height settlement: yes Wafer shape measurement by alignment camera various alignment model changes function

Detail more >>
Used Semiconductor Equipment -- Prober

Used Semiconductor Equipment -- Prober

Used Semiconductor Equipment -- Prober


DescriptionP-8 Prober
ManufacturerTokyo Electron
Wafer SizeΦ8"
SizeW:1700mm D:1250mm H:1500mm
S/NPA02344, PA01241, PA04005, PA01240
Main spec1. Manufactuing year: 1996-1997
2. Power: AC100/15A
3. Test bench used for T3347A tester
4. High temperature chuck (RT~150°C)
5. with AUTO HF
6. I/F=TTL
7. 26-digit printer
8. SACC(probe card automatically changeable)
9. IP/DP
FunctionUsed as a transport device for measuring the 2PC-based MOS devices.
Equipment status 1. Storage location: cleaming room
2. Packing: Not yet
3. Originally purchased as new equipment
4. used until Feb 2011
5. No need to overhaul
6. No HDD
Detail more >>
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